Key Features.
- Fully automatic data acquisition with no requirement to pre-set acquisition parameters
- Full edit control of acquisition parameters
- Automatic save and recall of different acquisition recipes
- Powerful automatic interscan clean routines with fully adjustable duty cycle
- Automated control of probe position by a Linear Drive Z stage (if fitted)
- Multi-scan data file acquisition with real-time display
- Real-time automatic analysis of acquired data with a range of advanced theories
- User selectable display of analyzed plasma parameters plotted relative to time or and probe position
- Surface (3-D) display of analyzed parameters
- Trend report of calculated plasma parameters plotted relative to the probe position and time
- Manual, semi-automatic and fully automatic analysis of file data
- Specific plasma probe data functions for the extraction of plasma parameters
- Multiple graph displays – any size
- Multiple files open simultaneously
- Standard math operations on data curves (add, average, smooth, differentiate)
- Data curves may be combined mathematically, including a scan averaging feature
- Per scan report of calculated plasma parameters including analysis statistics, slopes and intercepts
- Dynamic Data Exchange (DDE) export of data to other Windows® applications
- Import and analysis of ASCII X-Y data files, including those acquired on other equipment
- Print graphs and reports to many printer/plotter devices
Downloads.
Hiden's published documents for this instrument.
Related instruments.
ESPion
An advanced Langmuir probe for plasma diagnostics, measuring electrical properties of plasmas such as plasma potential, floating potential and electron temperature.
Talk to an applications engineer.
Describe the experiment. An applications engineer reads it personally and typically replies within one business day.
Or call 1-888-96-HIDEN, Monday to Friday, 8:30am to 5pm ET.