XBS.
A quadrupole mass spectrometer for monitoring multiple beam sources simultaneously, serving as a deposition rate monitor for molecular beam analysis and deposition control.
Key Features.
- High sensitivity, with a minimum detectable partial pressure of 2.5x10⁻¹⁴ mbar
- Mass range of 320 or 510 amu
- Crossbeam ion source, beam acceptance through +/- 35° to transverse axis
- Beam acceptance apertures configured for beam source positions
- Optional water-cooled shroud
Specifications.
- Analyzer
- Quadrupole mass spectrometer
- Mass range options
- 320 or 510 amu
- Detection limit
- Minimum detectable partial pressure of 2.5x10⁻¹⁴ mbar
- Ionization
- Crossbeam ion source, with beam acceptance through +/- 35° to the transverse axis
- Standard inlet
- Beam acceptance apertures configured individually for each process chamber source position, as replaceable plug-in elements
- Control software
- MASsoft Professional
- Mass filter
- Triple stage mass filter
- Beam acceptance
- Through a 70° cone
- Probe shroud
- Optional water-cooled shroud
Downloads.
Hiden's published documents for this instrument.
Related instruments.
HALO 201 MBE
A residual gas analyzer for molecular beam epitaxy, built for prolonged use in MBE environments with molybdenum wiring and a contamination resistant ion source shroud.
RGA Series
A broad range of quadrupole residual gas analyzers for contamination monitoring, leak detection and analysis of the species within the vacuum chamber.
HPR-30 Series
Vacuum process gas analyzers designed for fast response, high sensitivity analysis of gas and vapor species in vacuum processes.
Talk to an applications engineer.
Describe the experiment. An applications engineer reads it personally and typically replies within one business day.
Or call 1-888-96-HIDEN, Monday to Friday, 8:30am to 5pm ET.