Ion Source Options for Residual Gas Analyzers.

Hiden offers interchangeable electron impact and application-specific ion sources for configuring residual gas analyzers around pressure, sample geometry and gas chemistry. Options support routine residual gas analysis (RGA) work, UHV desorption, high-pressure sampling, molecular beams, reactive gases, and low outgassing measurements.

Match the ion source to the vacuum experiment

The standard radial source suits general RGA applications, while the UHV low-profile source places the ionization region closer to a desorption surface. Closed sources accept direct gas input for high-pressure studies with differential pumping. Basic and XBS cross-beam designs maintain an unobstructed path through the ionizing region for molecular beam analysis and MBE deposition monitoring.

Platinum construction improves operation with reactive gases, while gold-plated and vacuum-fired sources reduce outgassing for demanding UHV measurements. Four-lens optics support low-energy positive and negative ions from stimulated desorption experiments. The laser cross beam source includes two orthogonal unobstructed pathways for laser photon ionization within the source cage region, providing an alternative to electron impact and electron -attachment ionization.