Custom SIMS Solutions.
The low extraction field characteristics and modular nature of Hiden quadrupole SIMS spectrometers, coupled with an experienced custom design team, allow specialist surface analysis tools to be realized; whether adding SIMS to an existing system or designing a complete instrument from scratch.
Key Features.
- Custom systems use standard UHV components
- Software is the same as that used on the SIMS workstation
- 3D characterization
- Nanometer depth resolution
- Integration with third party ion guns, XPS, other instruments
- Full 3D CAD design and modeling
- Experience in both research and production integration
Downloads.
Hiden's published documents for this instrument.
Hi5 – Simultaneous Positive and Negative FIB-SIMS
pdf
Hi5 Flyer
pdf
Mass Spectrometers for Surface Analysis
pdf
Mass Spectrometers for Thin Films, Plasma and Surface Engineering
pdf
SIMS Applications
pdf
Suib Group, University of Connecticut – The Effectiveness of Hiden’s Compact SIMS Analysis System for Various Research Applications
pdf
Related instruments.
EQS
A system for the analysis of secondary positive and negative ions from solid samples
IG20
A 5keV Argon or Oxygen ion source for UHV surface analysis applications
IG5C
A 5keV Cesium ion gun for UHV surface analysis applications
Talk to an applications engineer.
Describe the experiment. An applications engineer reads it personally and typically replies within one business day.
Or call 1-888-96-HIDEN, Monday to Friday, 8:30am to 5pm ET.