Scientific Equipment for Surface Analysis
Complete workstation and bolt-on probes for elemental SIMS mapping, depth profiling, composition analysis and interface studies.
Industry-Leading Secondary Ion Mass Spectrometers and Technical Instruments for Surface Analysis
Hiden Inc. is a respected developer, manufacturer, supplier, and champion of scientific equipment. Our high-performance instruments are used in a diverse variety of scientific applications with molecular accuracy.
Our products, workstations, and probes remain the core of many institutions— we hope they will serve yours equally.
Hiden Inc.’s Secondary Ion Mass Spectrometers and Instruments for Surface Analysis
Compact SIMS
UHV surface analysis system for thin film depth profiling – featuring 10 sample rotary carousel, oxygen primary ion gun and positive ion measurements of layer structures, surface contamination and impurities.
Applications
- Solar Cells
- Glass Coating
- Metallic Thin Films
Auto SIMS
Self contained automated SIMS tool for routine and repetitive surface analysis – ideally suited to the measurement of thin films, contamination and doping from the top monolayer to micron depth in both conductive and insulating material.
Applications
- Thin Films
- Surface Modification
- Coating
- Map Large Areas
SIMS/SNMS Workstation
High performance static and dynamic SIMS for detailed surface composition analysis and depth profiling – featuring SNMS for quantification in thin film composition measurements.
Applications
- Catalysis
- Surface Analysis
- Thin Film & Surface Engineering
- Nanotechnology
- Fuel Cells
- Semiconductors
ToF-qSIMS Workstation
The Hiden ToF-qSIMS system is designed for surface analysis and depth profiling applications of a wide range of materials including polymers, pharmaceuticals, superconductors, semiconductors, alloys, optical and functional coatings and dielectrics, with measurement of trace components to sub-ppm levels.
Applications
- Surface Analysis
- Thin Film & Surface Engineering
- Surface Science
-
Nanotechnology
- Fuel Cells
EQS
Bolt-on SIMS probe for the analysis of positive and negative secondary ions from solid samples. Includes high transmission triple filter quadrupole, 45 degree electrostatic sector field energy analyzer and on-axis ion collection for ease of installation on surface analysis instrumentation.
Applications
- Surface Analysis
- Thin Film & Surface Engineering
- Catalysis
- Surface Science
- FIB-SIMS
MAXIM
Bolt-on SIMS/SNMS analyzer for surface composition and elemental SIMS mapping – featuring 30 degree acceptance angle, mounting axis parallel to the plane of the sample and tolerance to sample charging for ease of inclusion with other optics and analysis of insulators.
Applications
- Catalysis
- Surface Analysis
- Thin Film & Surface Engineering
- Surface Science
- Nanotechnology
IG5C
A 5keV Caesium ion gun for SIMS/SNMS analysis and elemental mapping of electronegative species. Suitable for all SIMS applications, dynamic, static and imaging.
Applications
- Catalysis
- Surface Analysis
- Thin Film & Surface Engineering
- Surface Science
- Nanotechnology
IG20
A 5keV Argon or Oxygen primary ion source for SIMS/SNMS analysis and elemental mapping of electropositive species.
Applications
- Surface Analysis
- Thin Films and Surface Engineering
- Surface Science
- Nanotechnology
- Auger Electron Spectroscopy
- Ion Beam Sputtering
- Rastering Depth Profiling